X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California

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X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.]

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986

形態:

vi, 156 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 690 <BA0022700X>

著者名:

ISBN:

9780892527250 [0892527250] (pbk.)

書誌ID:

BA24030633

子書誌情報

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書誌詳細

注記:	Includes bibliographies and index
主題:	Materials--Testing--Congresses; Non-destructive testing--Congresses; X-ray spectroscopy--Congresses
言語:	英語

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