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1.

図書

図書
John Sheffield
出版情報: New York : Academic Press, 1975  xii, 305 p. ; 24 cm
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2.

図書

図書
J.D. Swift and M.J.R. Schwar
出版情報: London : Iliffe Books, 1970  ix, 334 p. ; 22 cm
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3.

図書

図書
[by] Paul M. Chung, Lawrence Talbot, Kenell J. Touryan
出版情報: New York : Springer-Verlag, 1975  xiv, 150 p. ; 24 cm
シリーズ名: Applied physics and engineering
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4.

図書

図書
edited by W. Lochte-Holtgreven ; Contributors: J. Richter...[et al.]
出版情報: Amsterdam : North-Holland, 1968  xvi, 928 p. ; 23 cm
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5.

図書

図書
Katsunori Muraoka, Mitsuo Maeda ; [English translation by Mark Bowden]
出版情報: Philadelphia : Institute of Physics Pub., c2001  x, 295 p. ; 24 cm
シリーズ名: Plasma physics series
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目次情報: 続きを見る
Foreword
Fundamentals / Part I:
Laser-Aided Diagnostics of Gases and Plasmas / 1:
Properties of Gases / 1.1:
Classification of Gaseous States / 1.1.1:
Fundamental Parameters used to describe Gases / 1.1.2:
Properties of Plasmas / 1.2:
Different Areas of Plasma Applications / 1.2.1:
Fundamental Parameters used to describe Plasmas / 1.2.2:
Summary / 1.2.3:
Different States of Matter and their Kinetic Properties / 1.3:
Characteristics of Laser Light / 1.4:
Coherence / 1.4.1:
Short Pulse Generation / 1.4.2:
Advantages of Laser-Aided Measurement Methods / 1.5:
References
Basic Principles of Different Laser-Aided Measurement Techniques / 2:
Interaction of Electromagnetic Waves with Single Particles / 2.1:
Thomson Scattering by Charged Particles / 2.1.1:
Mie and Rayleigh Scattering / 2.1.2:
Raman Scattering / 2.1.3:
Resonant Absorption / 2.1.4:
Photo-Ionization / 2.1.5:
Laser Propagation through Gases and Plasmas / 2.2:
Reflection / 2.2.1:
Transmission / 2.2.2:
Refraction / 2.2.3:
Scattering / 2.2.4:
Spectral Profile Measurements / 2.2.5:
Summary of Line Broadening Mechanisms / 2.3.1:
Examples of Spectral Widths / 2.3.2:
Spectral Profile Measurement Techniques / 2.3.3:
Hardware for Laser Measurements / 3:
Lasers / 3.1:
Overview of Laser Systems / 3.1.1:
Control of Laser Light / 3.1.2:
Gas Lasers / 3.1.3:
Solid-State and Semiconductor Diode Lasers / 3.1.4:
Tunable Lasers / 3.1.5:
Nonlinear Wavelength Conversion Devices / 3.2:
Nonlinear Optical Effects / 3.2.1:
Higher Harmonic Generation and Frequency Mixing / 3.2.2:
Optical Parametric Oscillators / 3.2.3:
Stimulated Scattering / 3.2.4:
Optical Elements and Optical Instruments / 3.3:
Dispersion Elements and Spectrometers / 3.3.1:
Interferometers / 3.3.2:
Optical Waveguides / 3.3.3:
Other Optical Elements / 3.3.4:
Detectors and Signal Processing / 3.4:
Light Detectors / 3.4.1:
Imaging Detectors / 3.4.2:
Noise Sources and Signal Recovery / 3.4.3:
Observation of Fast Waveforms / 3.4.4:
Applications and Measurements / Part II:
Plasma Measurements / 4:
Overview of Plasma Spectroscopic Methods / 4.1:
Laser-Aided Measurements in High-Temperature Plasmas / 4.2:
Measurement of Plasma Density and Temperature / 4.2.1:
Measurement of Density and Temperature of Neutral and Impurity Species / 4.2.2:
Measurement of Electric and Magnetic Fields and Plasma Fluctuations / 4.2.3:
Laser-Aided Measurements in Discharge Plasmas / 4.3:
Measurement of Electric Field / 4.3.1:
Measurement of Electron Density and Temperature / 4.3.2:
Measurement of Reaction Products / 4.3.3:
Combustion Measurements / 5:
Combustion Fields and Laser-Aided Measurements / 5.1:
Measurement of Particle Densities / 5.1.1:
Measurement of Temperature / 5.1.2:
Measurement of Velocity / 5.1.3:
Examples of Combustion Measurements / 5.2:
Measurements by Laser-Induced Fluorescence Spectroscopy / 5.2.1:
Measurements by Coherent Anti-Stokes Raman Spectroscopy / 5.2.2:
Measurements by Degenerate Four-Wave Mixing / 5.2.3:
Measurements in Gas Flow Systems / 6:
Measurement of Refractive Index Changes (Density Measurements) / 6.1:
Schlieren Method / 6.1.1:
Shadowgraphy / 6.1.2:
Interferometry / 6.1.3:
Holography / 6.1.4:
Measurement of Flow Velocity / 6.2:
Measurement Techniques / 6.2.1:
Examples of Measurements / 6.2.2:
Imaging of Gas Flows by Laser-Induced Fluorescence / 6.3:
Measurement of Density Distributions / 6.3.1:
Measurement of Temperature Distributions / 6.3.2:
Laser Processing Measurements / 7:
Laser Processing / 7.1:
Measurement Methods in Laser Processing / 7.2:
Different Methods and their Advantages / 7.2.1:
Detection of Atomic and Molecular Species / 7.2.2:
Examples of Laser Processing Measurements / 7.3:
Measurements of Laser CVD Processes / 7.3.1:
Measurements of Laser Ablation Processes / 7.3.2:
Analytical Chemistry / 8:
Analytical Chemistry and Laser Spectroscopy / 8.1:
Examples of Analysis using Laser Spectroscopic Techniques / 8.2:
Analysis using Laser Raman Spectroscopy / 8.2.1:
Analysis using Laser-Induced Emission Spectroscopy / 8.2.2:
Analysis using Laser-Induced Fluorescence Spectroscopy / 8.2.3:
Analysis using Laser Ionization Spectroscopy / 8.2.4:
Analysis using Laser Photothermal Spectroscopy / 8.2.5:
Remote Sensing / 9:
LIDAR and Monitoring of the Atmosphere / 9.1:
LIDAR Theory / 9.1.1:
Different LIDAR Techniques / 9.1.2:
Representative LIDAR Experiments / 9.2:
Mie Scattering LIDAR / 9.2.1:
Rayleigh Scattering LIDAR / 9.2.2:
Differential Absorption LIDAR (DIAL) / 9.2.3:
Raman LIDAR / 9.2.4:
Index
Foreword
Fundamentals / Part I:
Laser-Aided Diagnostics of Gases and Plasmas / 1:
6.

電子ブック

EB
V.P. Savinov
出版情報: [London] : Taylor & Francis Group, 2018  1 online resource (xx, 322 p.)
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7.

図書

図書
E. Oks
出版情報: Berlin ; Tokyo : Springer-Verlag, c1995  xii, 182 p. ; 25 cm
シリーズ名: Springer series on atoms + plasmas ; 9
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8.

図書

図書
I.H. Hutchinson
出版情報: Cambridge [Cambridgeshire] : Cambridge University Press, 1987  xv, 364 p. ; 24 cm
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9.

図書

図書
edited by Richard H. Huddlestone and Stanley L. Leonard
出版情報: New York, N.Y. : Academic Press, 1965  xii, 627 p. ; 24 cm
シリーズ名: Pure and applied physics : a series of monographs and textbooks ; v. 21
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