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Residual stress : measurement by diffraction and interpretation / Ismail C. Noyan, Jerome B. Cohen

Format:
Book
Published:
New York ; Tokyo : Springer, c1987
Description:
x, 276 p. ; 25 cm
Series:
Materials research and engineering <BA00092534>
Authors:
ISBN:
9780387963785 [0387963782] (: us)
9783540963783 [3540963782] (: gw)
9781461395713 [1461395712]
NCID:
BA0088647X
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