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Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain

Format:
Book
Published:
New York : M. Dekker, c1978
Description:
xii, 450 p. ; 23 cm
Series:
Statistics : textbooks and monographs ; v. 24 <BA0001061X>
Authors:
Bain, Lee J., 1939- <DA02614921>  
ISBN:
9780824766658 [0824766652]
9780824776190 [0824776194]
NCID:
BA10569542
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