Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt
- Edition:
- 2nd ed
- Format:
- Book
- Published:
- New York : M. Dekker, c1991
- Description:
- vii, 496 p. ; 24 cm
- Series:
- Statistics : textbooks and monographs ; v. 115 <BA0001061X>
- Authors:
- ISBN:
- 9780824785062 [0824785061]
- NCID:
- BA1235996X
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