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Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt

Edition:
2nd ed
Format:
Book
Published:
New York : M. Dekker, c1991
Description:
vii, 496 p. ; 24 cm
Series:
Statistics : textbooks and monographs ; v. 115 <BA0001061X>
Authors:
ISBN:
9780824785062 [0824785061]
NCID:
BA1235996X
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