Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

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Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors: C.V. Thompson, J.R. Lloyd

Format:

Book

Published:

Pittsburgh, PA : Materials Research Society, c1992

Description:

ix, 328 p. ; 24 cm

Series:

Materials Research Society symposium proceedings ; v. 265 <BA00013775>

Authors:

ISBN:

9781558991606 [1558991603]

NCID:

BA18823607

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Bibliography Details

Note:	Includes bibliographical references and index
Subject:	Electrodiffusion--Congresses; Microelectronics--Materials--Testing--Congresses; Microelectronics--Reliability--Congresses; Microstructure--Congresses
Language:	English

Tokyo Tech Book Review

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