Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A. / editors, O.J. Glembocki ... [et al.]
- Format:
- Book
- Published:
- Pittsburgh : Materials Research Society, c1994
- Description:
- xv, 505 p. ; 24 cm
- Series:
- Materials Research Society symposium proceedings ; v. 324 <BA00013775>
- Authors:
- ISBN:
- 9781558992238 [1558992235]
- NCID:
- BA23153172
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