Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors, William F. Filter ... [et al.]

Format:: Book
Published:: Pittsburgh, Pa. : Materials Research Society, c1996
Description:: xv, 583 p. ; 24 cm
Series:: Materials Research Society symposium proceedings ; v. 428 <BA00013775>
Authors:: Filter, William F.
ISBN:: 9781558993310 [1558993312]
NCID:: BA2918019X

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Note:	Includes index
Subject:	Electrodiffusion--Congresses; Microelectronics--Materials--Testing--Congresses; Microelectronics--Reliability--Congresses; Microstructure--Congresses
Language:	English

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