Analytical and diagnostic techniques for semiconductor materials, devices and processes 7

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Analytical and diagnostic techniques for semiconductor materials, devices and processes 7 / editors, D. K. Schroder ... [et al.]. ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology

Format:

Book

Published:

Pennington, N.J. : Electrochemical Society, c2007

Description:

viii, 394 p. ; 23 cm + 1 CD-ROM

Series:

ECS transactions ; vol. 11, no. 3 <BA78566502>

Authors:

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

Schroder, D. K.

Electrochemical Society. Meeting <DA03398898>

Electrochemical Society. Electronics and Photonics

Electrochemical Society. Dielectric Science and Technology Division <DA06421624>

European Solid State Device Research Conference <DA00938219>

1 more

ISBN:

9781566775694 [1566775698]
9781566775793 [1566775795] (: CD-ROM)

NCID:

BA84582092

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Bibliography Details

Other titles:	Analytical Techniques for Semiconductor Materials and Process Characterization ALTECH
ISSN:	19385862
Note:	"... was part of the Fall 2007 Electrochemical Society Meeting in Washington, DC, held on October 7-12, 2007."--on pref "... also contains a CD-ROM with the papers of the ALTECH 07 symposium Analytical Techniques for Semiconductor Materials and Process Characterization V, held as part of the Solid State Device Research Conference (ESSDERC) 2007 in Munich, Germany on September 13-14, 2007."--on pref Includes bibliographical references and indexes
Subject:	Semiconductors--Analysis Congresses
Language:	English

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