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1. Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (:ECS ; :SPIE)
editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
Published: Pennington, N.J. : Electrochemical Society, c1999  ix, 552 p. ; 24 cm
Series: Proceedings / [Electrochemical Society] ; v. 99-16
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3895
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2. Analytical and diagnostic techniques for semiconductor materials, devices and processes 7 (: CD-ROM)
editors, D. K. Schroder ... [et al.]. ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology
Published: Pennington, N.J. : Electrochemical Society, c2007  viii, 394 p. ; 23 cm
Series: ECS transactions ; vol. 11, no. 3
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