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1. Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble/France : crystalline defects and contamination: their impact and control in device manufacturing
edited by B.O. Kolbesen ... [et al.] ; [sponsored by the] Electronics Division
Published: Pennington, NJ : Electrochemical Society, c1993  ix, 283 p. ; 23 cm
Series: Proceedings / [Electrochemical Society] ; v. 93-15
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2. ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; [sponsored by] Electronics Division
Published: Pennington, NJ : Electrochemical Society, c1995  ix, 366 p. ; 23 cm
Series: Proceedings / [Electrochemical Society] ; v. 95-30
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3. Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
editors, Bernd O. Kolbesen ... [et al.] ; Electronics Division [of the Electrochemical Society]
Published: Pennington, NJ : Electrochemical Society, c1997  x, 518 p. ; 23 cm
Series: Proceedings / [Electrochemical Society] ; v. 97-22
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4. Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (:ECS ; :SPIE)
editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
Published: Pennington, N.J. : Electrochemical Society, c1999  ix, 552 p. ; 24 cm
Series: Proceedings / [Electrochemical Society] ; v. 99-16
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3895
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