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1. ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; [sponsored by] Electronics Division
Published: Pennington, NJ : Electrochemical Society, c1995  ix, 366 p. ; 23 cm
Series: Proceedings / [Electrochemical Society] ; v. 95-30
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2.

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2. Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany
editors, B.O. Kolbesen ... [et al.]
Published: Pennington, N.J. : Electrochemical Society, c2001  x, 362 p. ; 24 cm
Series: Proceedings / [Electrochemical Society] ; v. 2001-29
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3. Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France
editors, Bernd O. Kolbesen ... [et al.] ; sponsoring division, Electronics and Photonics
Published: Pennington, N.J. : Electrochemical Society, c2005  viii, 190 p. ; 24 cm
Series: Proceedings / [Electrochemical Society] ; v. 2005-10
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Book
Book
4. Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (:ECS ; :SPIE)
editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
Published: Pennington, N.J. : Electrochemical Society, c1999  ix, 552 p. ; 24 cm
Series: Proceedings / [Electrochemical Society] ; v. 99-16
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3895
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