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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors, William F. Filter ... [et al.]

資料種別:
図書
出版情報:
Pittsburgh, Pa. : Materials Research Society, c1996
形態:
xv, 583 p. ; 24 cm
シリーズ名:
Materials Research Society symposium proceedings ; v. 428 <BA00013775>
著者名:
Filter, William F.  
ISBN:
9781558993310 [1558993312]
書誌ID:
BA2918019X
子書誌情報
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