Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors, William F. Filter ... [et al.]

資料種別:: 図書
出版情報:: Pittsburgh, Pa. : Materials Research Society, c1996
形態:: xv, 583 p. ; 24 cm
シリーズ名:: Materials Research Society symposium proceedings ; v. 428 <BA00013775>
著者名:: Filter, William F.
ISBN:: 9781558993310 [1558993312]
書誌ID:: BA2918019X

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注記:	Includes index
主題:	Electrodiffusion--Congresses; Microelectronics--Materials--Testing--Congresses; Microelectronics--Reliability--Congresses; Microstructure--Congresses
言語:	英語

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