Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A. / editors, S. Ashok ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Warrendale, Pa : Materials Research Society, c1998
- 形態:
- xvii, 679 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 510 <BA00013775>
- 著者名:
- ISBN:
- 9781558994164 [1558994165]
- 書誌ID:
- BA3837004X
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