
所蔵情報QRコード
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A. / editors, S. Ashok ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Warrendale, Pa : Materials Research Society, c2002
- 形態:
- xv, 493 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 719 <BA00013775>
- 著者名:
- 書誌ID:
- BA58959499
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