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Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. / editors, Subhash Mahajan, James W. Corbett

資料種別:
図書
出版情報:
New York : North-Holland, c1983
形態:
xv, 582 p. ; 24 cm
シリーズ名:
Materials Research Society symposium proceedings ; v. 14 <BA00013775>
著者名:
ISBN:
9780444008121 [0444008128]
書誌ID:
BA00973122
子書誌情報
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