Advances in X-ray analysis

9780306419393 [0306419394] (v. 28)
9780306429323 [0306429322] (v. 31)
9780306432361 [0306432366] (v. 32)
9780306436154 [0306436159] (v. 33)
9780306440038 [0306440032] (v. 34)
9780306442490 [0306442493] (v. 35A)
9780306442490 [0306442493] (v. 35B)
9780306445712 [0306445719] (v. 36)
9780306449017 [0306449013] (v. 37)
9780306450457 [0306450453] (v. 38)
9780306458033 [0306458039] (v. 39)

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BA01581773

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注記:

Vol. 28: "Proceedings of the 1984 Denver Conference on the Applications of X-Ray Analysis, held July 30-August 3,1984, in Denver, Colo."
Vol. 31: "Proceedings of the 36th Annual Conference on Applications of X-ray Analysis, held August 3-7, 1987 in Denver, Colo."
Vol. 31, 32, 33, 34, 35. edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data
Vol. 32: "Proceedings of the 37th Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado"
Vol. 33: "Proceedings of the 38th Annual Conference on Applications of X-ray Analysis, held July 31-August 4, 1989, in Denver, Colorado"
Vol. 34: "Proceedings of the 39th Annual Conference on Applications of X-ray Analysis, held July 30-August 3, 1990, in Steamboat Springs, Colorado"
Vol. 35: "Proceedings of the 40th Annual Conference on Applications of X-ray Analysis, held August 7-16, 1991, in Steamboat Springs, Colorado"
Vol. 36, 37. edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data
Vol. 36: "Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held August 3-7, 1992, in Colorado Springs, Colorado"
Vol. 37: "Proceedings of the 42nd Annual Conference on Applications of X-Ray Analysis, held August 2-6, 1993, in Denver, Colorado"
Vol. 38: "Proceedings of the 43rd Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1994, in Steamboat Springs, Colorado"
vol. 39: "Proceedings of the 44th Annual Conference on Applications of X-Ray Analysis, held July 31-August 4, 1995, in Colorado Springs, Colorado"
vol. 40: "Proceedings of the 45th Annual Conference on Applications of X-Ray Analysis, held August 3-8, 1996, Denver, Colorado" CD-ROM
36th, 38th, 42nd : 1987, 1989, 1993 : Denver, Colorado
37th, 39-40th, 43rd : 1988, 1990-1991, 1994 : Steamboat Spring, Colorado
41st, 44th : 1992, 1995 : Colorado Spring, Colorado

主題:

光分析

言語:

英語

目次情報:

Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries

Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel

Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk

Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers / N.S. Murthy

Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples / V. Valvoda, et al.

Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films / I.C. Noyan ; C.C. Goldsmith

Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications

95 Additional Articles

Indexs

Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries

Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel

Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk

Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers / N.S. Murthy

Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples / V. Valvoda, et al.

Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films / I.C. Noyan ; C.C. Goldsmith

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