所蔵情報QRコード
Radiation effects in electronics : presented at a Joint Meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects and the Niagara-Finger Lakes Section of the American Nuclear Society, Syracuse, N.Y., Oct. 5-7, 1964 / American Society for Testing and Materials
- 資料種別:
- 図書
- 出版情報:
- Philadelphia : ASTM, 1965
- 形態:
- 236 p. ; 24 cm.
- シリーズ名:
- ASTM special technical publication ; No. 384 <BA00068096>
- 著者名:
- 書誌ID:
- BA01666774
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American Society for Testing Materials | |
American Society for Testing and Materials | |
ASTM International | |