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Radiation effects in electronics : presented at a Joint Meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects and the Niagara-Finger Lakes Section of the American Nuclear Society, Syracuse, N.Y., Oct. 5-7, 1964 / American Society for Testing and Materials

資料種別:
図書
出版情報:
Philadelphia : ASTM, 1965
形態:
236 p. ; 24 cm.
シリーズ名:
ASTM special technical publication ; No. 384 <BA00068096>
著者名:
American Society for Testing and Materials <DA00669569>  
書誌ID:
BA01666774
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