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Fractography in failure analysis : a symposium presented at May Committee Week, American Society for Testing and Materials, 1-6 May 1977, Toronto, Canada / B.M. Strauss and W.H. Cullen, Jr., editors

資料種別:
図書
出版情報:
Philadelphia : ASTM, c1978
形態:
390 p. ; 24 cm
シリーズ名:
ASTM special technical publication ; 645 <BA00068096>
著者名:
書誌ID:
BA02976493
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