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Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section

資料種別:
図書
出版情報:
Washington, D.C. : Computer Society Press of the IEEE
Los Angeles, CA : Order from Computer Society of the IEEE, c1987
形態:
xxxi, 1151 p. ; 28 cm
著者名:
ISBN:
9780818607981 [081860798X] (pbk.)
9780818647987 [0818647981] (microfiche)
9780818687983 [0818687983] (case)
書誌ID:
BA04374582
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