Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section
類似資料:
Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office | |
2
図書
Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983
IEEE Computer Society Press |
Institute of Electrical and Electronics Engineers |
Institute of Electrical and Electronics Engineers, order from IEEE Computer Society | |
International Test Conference |
International Test Conference |
International Test Conference | |
International Test Conference |
International Test Conference |