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Proceedings / IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society, Test Technology Committee

資料種別:

図書

出版情報:

Washington, D.C. : IEEE Computer Society Press
Los Angeles, CA : Order from IEEE Computer Society, c1986

形態:

vii, 179 p. ; 28 cm

著者名:

ISBN:

9780818607325 [0818607327] (pbk.)
9780818687327 [0818687320] (hard)
9780818647321 [0818647329] (microfiche)

書誌ID:

BA04424691

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographies and index "IEEE Computer Society order number 732." "IEEE catalog number 86CH2296-2."
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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