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Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 / sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section

資料種別:
図書
出版情報:
Washington, D.C. : IEEE Computer Society Press, c1986
形態:
xxx, 1009 p. ; 28 cm
著者名:
ISBN:
9780818607264 [0818607262] (pbk.)
9780818647260 [0818647264] (microfiche)
9780818687266 [0818687266] (hard)
書誌ID:
BA04429152
子書誌情報
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