所蔵情報QRコード
Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963 / Symposium on Advances in electron Metallography ; American Society for Testing and Materials. Committee E-4 on Metallography
- 資料種別:
- 図書
- 出版情報:
- Philadelphia : ASTM, c1964
- 形態:
- vi, 89 p. ; 23 cm
- シリーズ名:
- ASTM special technical publication ; no. 372 <BA00068096>
- 著者名:
- 書誌ID:
- BA04549493
類似資料:
American Society for Testing Materials | |
American Society for Testing Mateirals |
American Society for Testing and Materials |