Blank Cover Image
所蔵情報QRコード

New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:
図書
出版情報:
Washington, D.C. : Computer Society Press of the IEEE, c1988
形態:
xxx, 1005 p. ; 28 cm
著者名:
ISBN:
9780818608704 [0818608706] (paper)
9780818648700 [0818648708] (microfiche)
9780818688706 [081868870X] (case)
書誌ID:
BA06995955
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

International Test Conference, IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia …

Computer Society Press of the IEEE, Order from Computer Society of the IEEE

International Test Conference, IEEE Computer Society. Test Technology Technical Council, Institute of Electrical and …

International Test Conference

International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics …

IEEE Computer Society Press

International Test Conference, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and …

Tokyo : IEEE Computer Society Press

International Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics …

Institute of Electrical and Electronics Engineers, order from IEEE Computer Society

Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. …

Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office

Test Conference, IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. …

Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office

Autotestcon, Institute of Electrical and Electronics Engineers, Institute of Electrical and Electronics Engineers. …

Institute of Electrical and Electronics Engineers

International Test Conference, IEEE Computer Society, IEEE Computer Society. Test Technology Technical Council, …

International Test Conference

Autotestcon, Institute of Electrical and Electronics Engineers, Institute of Electrical and Electronics Engineers. …

Institute of Electrical and Electronics Engineers

International Test Conference, IEEE Computer Society. Test Technology Technical Council, Institute of Electrical and …

International Test Conference

International Test Conference, IEEE Computer Society

International Test Conference

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12