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Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989 / European Test Conference ; Société des électriciens et des électroniciens ; IEEE Computer Society ; Institute of Electrical and Electronics Engineers

資料種別:
図書
出版情報:
Washington, D.C. : IEEE Computer Society Press, c1989
形態:
xiv, 417 p. ; 28 cm
著者名:
ISBN:
9780818619373 [0818619376] (: pbk.)
9780818659379 [0818659378] (: microfiche)
9780818689376 [0818689374] (: hard)
書誌ID:
BA07686774
子書誌情報
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