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Semiconductor device reliability / edited by A. Christou and B.A. Unger

資料種別:
図書
出版情報:
Dordrecht ; Boston : Kluwer Academic Publishers, c1990
形態:
ix, 575 p.: ill. ; 25 cm
シリーズ名:
NATO ASI series ; ser. E . Applied sciences ; no. 175 <BA00020624>
著者名:
ISBN:
9780792305361 [0792305361]
書誌ID:
BA0790597X
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