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X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California / Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988
形態:
viii, 271 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 984 <BA0022700X>
著者名:
ISBN:
9780819400192 [081940019X]
書誌ID:
BA07982154
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