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Evaluation of advanced semiconductor materials by electron microscopy / edited by David Cherns

資料種別:
図書
出版情報:
New York : Plenum Press, c1989
形態:
xi, 412 p. ; 27 cm
シリーズ名:
NATO ASI series ; ser. B, Physics ; v. 203 <BA00020624>
著者名:
ISBN:
9780306433627 [0306433621]
書誌ID:
BA08059780
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