Accelerated testing : statistical models, test plans and data analysis

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Accelerated testing : statistical models, test plans and data analysis / Wayne Nelson

資料種別:: 図書
出版情報:: New York : Wiley, c1990
形態:: xiv, 601 p. ; 25 cm
シリーズ名:: Wiley series in probability and mathematical statistics ; . Applied probability and statistics <BA00019013>
著者名:: Nelson, Wayne, 1936- <DA0261466X>
ISBN:: 9780471522775 [0471522775]
書誌ID:: BA10134812

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注記:

"A Wiley-Interscience publication."
Includes bibliographical references (p. 561-577) and index

主題:

Accelerated life testing--Statistical methods; Failure time data analysis; Reliability (Engineering)--Statistical methods

言語:

英語

目次情報:

Models for Life Tests with Constant Stress

Graphical Data Analysis

Complete Data and Least Squares Analyses

Censored Data and Maximum Likelihood Methods

Test Plans

Competing Failure Modes and Size Effect

Least-Squares Comparisons for Complete Data

Maximum Likelihood Comparisons for Censored and Other Data

Models and Data Analyses for Step and Varying Stress

Accelerated Degradation

Appendix

References

Index

Models for Life Tests with Constant Stress

Graphical Data Analysis

Complete Data and Least Squares Analyses

Censored Data and Maximum Likelihood Methods

Test Plans

Competing Failure Modes and Size Effect

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