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Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida / John Nestler, Philip I. Richardson, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1988
形態:
vi, 106 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 941 <BA0022700X>
著者名:
ISBN:
9780892529766 [0892529768]
書誌ID:
BA10253913
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