Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida / John Nestler, Philip I. Richardson, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash., USA : SPIE, c1988
- 形態:
- vi, 106 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 941 <BA0022700X>
- 著者名:
- ISBN:
- 9780892529766 [0892529768]
- 書誌ID:
- BA10253913
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