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Piece recognition and image processing : 30 June 1988, Dearborn, Michigan / Wayne Wiitanen, chair/editor ; cosponsored by ESD, the Engineering Society, SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1988
形態:
vi, 132 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 956 <BA0022700X>
著者名:
ISBN:
9780892529919 [0892529911]
書誌ID:
BA1025681X
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