2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

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2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers

資料種別:

図書

出版情報:

Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, c1980

形態:

x, 228 p. ; 28 cm

シリーズ名:

Proceedings of the Society of Photo-Optical Instrumentation Engineers ; v. 210 <BA0118856X>

著者名:

European Conference on Optics Applied to Metrology <DA08726553>

Grosmann, Michel <DA08726564>

Meyrueis, Patrick <DA04847567>

Optics, Photonics, and Iconics Engineering Meeting <DA08732090>

European Photonics Association <DA04847691>

Society of Photo-optical Instrumentation Engineers <DA00848546>

さらに 1 件

ISBN:

9780892522385 [0892522380]

書誌ID:

BA11161515

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and indexes
主題:	Holographic interferometry--Congresses; Optical measurements--Congresses; Speckle metrology--Congresses
言語:	英語

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