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Physical measurement and analysis of thin films / edited by E. M. Murt and W. G. Guldner

資料種別:
図書
出版情報:
New York : Plenum Press, 1969
形態:
xi, 194 p. ; 24 cm
シリーズ名:
Progress in analytical chemistry ; v. 2 <BA11236090>
著者名:
書誌ID:
BA11236002
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