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The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:
図書
出版情報:
Los Alamitos, Calif. : Tokyo : IEEE Computer Society Press, c1990
形態:
xvi, 1083 p. ; 29 cm
著者名:
ISBN:
9780818620645 [0818620641] (: paper)
9780818660641 [0818660643] (: microfiche)
9780818690648 [081869064X] (: case)
書誌ID:
BA11598808
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