The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

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The changing philosophy of test : International Test Conference 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:

図書

出版情報:

Los Alamitos, Calif. : Tokyo : IEEE Computer Society Press, c1990

形態:

xvi, 1083 p. ; 29 cm

著者名:

ISBN:

9780818620645 [0818620641] (: paper)
9780818660641 [0818660643] (: microfiche)
9780818690648 [081869064X] (: case)

書誌ID:

BA11598808

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	2064 90CH29106 264620X
注記:	"Computer Society order number 2064." "IEEE catalog number 90CH2910-6." "SAN 264-620X." Includes bibliographies and index
言語:	英語

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