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Metallographic specimen preparation: optical and electron microscopy / edited by James L. McCall and William M. Mueller

資料種別:

図書

出版情報:

New York : Plenum Press, 1974

形態:

viii, 358 p. ; 26 cm

著者名:

ISBN:

9780306307911 [030630791X]

書誌ID:

BA12135791

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書誌詳細

注記:	Proceedings of a conference sponsored by the International Metallographic Society and the American Society for Metals and held in Beverly Hills, Calif., Sept. 23-24, 1973 Includes bibliographical references
主題:	Electron metallography--Congresses; Metallographic specimens--Congresses
言語:	英語

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1 図書 Proceedings of the seventh Annual Technical Meeting of the International Metallographic Society (: set. ; Part A ; Part B) French, P. M. (Peter Michael), 1935-, Gray, Robert J., McCall, James L., International Metallographic Society American Elsevier Pub. Co	7 図書 Electron microscopy of interfaces in metals and alloys Forwood, C. T., Clarebrough, L. M. Adam Hilger
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6 図書 Proceedings of the Sixth Annual Technical Meeting of the International Metallographic Society Fritzke, Gerald P., Richardson, James H. (James Howard), 1933-, McCall, James L., International Metallographic Society. … American Elsevier	12 図書 Proceedings of the eleventh Annual Technical Meeting of the Interanational Metallographic Society International Metallographic Society. Technical Meeting, Le May, Iain, Fallon, Paul A., McCall, James L. Elsevier

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