>> Google Books
所蔵情報QRコード

Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain, Max Engelhardt

版:
2nd ed
資料種別:
図書
出版情報:
New York : M. Dekker, c1991
形態:
vii, 496 p. ; 24 cm
シリーズ名:
Statistics : textbooks and monographs ; v. 115 <BA0001061X>
著者名:
ISBN:
9780824785062 [0824785061]
書誌ID:
BA1235996X
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

Gertsbakh, I. B.

M. Dekker

Mann, Nancy R., Schafer, Ray E., Singpurwalla, Nozer D.

Wiley

Cohen, A. Clifford, 1911-, Whitten, Betty Jones, 1937-

Mercel Dekker

Liu, A. F.

ASM International

Høyland, Arnljot, 1924-, Rausand, Marvin

J. Wiley

Pollard, David, 1950-

Institute of Mathematical Statistics, American Statistical Association

Herling, Robert J., 1945-

ASTM

Gnedenko, B. W. (Boris Wladimirowitsch), 1912-, Pavlov, I. V., Ushakov, I. A. (Igorʹ Alekseevich), Chakravarty, Sumantra

Wiley

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12