Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. / editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham
- 資料種別:
- 図書
- 出版情報:
- Pittsburgh, Pa. : Materials Research Society, c1991
- 形態:
- xiii, 367 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 208 <BA00013775>
- 著者名:
- ISBN:
- 9781558991002 [155899100X]
- 書誌ID:
- BA1240884X
類似資料:
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |