Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. | 東京工業大学附属図書館蔵書検索

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Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. / editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham

資料種別:

図書

出版情報:

Pittsburgh, Pa. : Materials Research Society, c1991

形態:

xiii, 367 p. ; 24 cm

シリーズ名:

Materials Research Society symposium proceedings ; v. 208 <BA00013775>

著者名:

ISBN:

9781558991002 [155899100X]

書誌ID:

BA1240884X

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and indexes
主題:	Diffraction--Congresses; Thin films--Optical properties--Congresses; Thin films--Surfaces--Congresses
言語:	英語

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