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Proceedings of the Second Symposium on Defects in Silicon : defects in silicon II / edited by W. Murray Bullis, Ulrich Gösele, Fumio Chimura ; assistant editors, W. Bergholz ... [et al.] ; Electronics and Dielectric Science and Technology Divisions

資料種別:
図書
出版情報:
Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, c1991
形態:
xi, 692 p. ; 23 cm
シリーズ名:
Proceedings / [Electrochemical Society] ; v. 91-9 <BA01323290>
著者名:
Symposium on Defects in Silicon <DA04123920>
Bullis, W. Murray, 1930- <DA04123942>
Gösele, Ulrich
Shimura, Fumio
Electrochemical Society. Electronics Division <DA0357072X>
Electrochemical Society. Dielectric Science and Technology Division
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書誌ID:
BA13248137
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KTK Scientific, D. Reidel, Distributed in the U.S.A. and Canada by Kluwer Academic

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