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Proceedings of the Second Symposium on Defects in Silicon : defects in silicon II / edited by W. Murray Bullis, Ulrich Gösele, Fumio Chimura ; assistant editors, W. Bergholz ... [et al.] ; Electronics and Dielectric Science and Technology Divisions

資料種別:

図書

出版情報:

Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, c1991

形態:

xi, 692 p. ; 23 cm

シリーズ名:

Proceedings / [Electrochemical Society] ; v. 91-9 <BA01323290>

著者名:

Symposium on Defects in Silicon <DA04123920>

Bullis, W. Murray, 1930- <DA04123942>

Gösele, Ulrich

Electrochemical Society. Electronics Division <DA0357072X>

Electrochemical Society. Dielectric Science and Technology Division

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書誌ID:

BA13248137

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書誌詳細

注記:	Includes bibliographical references and indexes
主題:	Semiconductors--Defects--Congresses; Silicon--Defects--Congresses
言語:	英語

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