Advanced tomographic imaging methods for the analysis of materials : symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A. / editors, Jerome L. Ackerman, William A. Ellingson
- 資料種別:
- 図書
- 出版情報:
- Pittsburgh, Pa. : Materials Research Society, c1991
- 形態:
- ix, 218 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 217 <BA00013775>
- 著者名:
- ISBN:
- 9781558991095 [1558991093]
- 書誌ID:
- BA13409520
類似資料:
Materials Research Society | |
Materials Research Society | |
SPIE--the International Society of Optical Engineering | |
Materials Research Society | |
Materials Research Society |
Materials Research Society |