Defect analysis in electron microscopy

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Defect analysis in electron microscopy / M.H. Loretto and R.E. Smallman

資料種別:

図書

出版情報:

London : Chapman and Hall, 1975

形態:

134 p. ; 24 cm

シリーズ名:

Science paperbacks ; 121 <BA00263400>

著者名:

ISBN:

9780470547601 [047054760X]
9780412137600 [0412137607] (cased edition)
9780412137709 [0412137704] (Science Paperback edition)

書誌ID:

BA1401594X

子書誌情報

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書誌詳細

注記:	"A Halsted Press book." Bibliography: p. 131 Includes index
主題:	Crystals--Defects; Electron microscopy
言語:	英語

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