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Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho

資料種別:
図書
出版情報:
Pittsburgh, Pa. : Materials Research Society, c1991
形態:
xiii, 358 p. ; 24 cm
シリーズ名:
Materials Research Society symposium proceedings ; v. 225 <BA00013775>
著者名:
ISBN:
9781558991194 [1558991190]
書誌ID:
BA14185757
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