Proceedings of the Symposia on Reliability of Semiconductor Devices/Interconnections, and Dielectric Breakdown, and Laser Process for Microelectronic Applications / edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen ; Dielectric Science & Technology and Electronics Divisions
- 資料種別:
- 図書
- 出版情報:
- Pennington, NJ : Dielectric Science & Technology, and Electronics Divisions, Electrochemical Society, c1992
- 形態:
- viii, 330 p.
- シリーズ名:
- Proceedings / [Electrochemical Society] ; v. 92-4 <BA01323290>
- 著者名:
- ISBN:
- 9781566770033 [1566770033]
- 書誌ID:
- BA14411619
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the Electrochemical Society, Inc. | |
the Electrochemical Society, Inc. |