International conference on wafer scale integration : proceedings, San Francisco, California, USA

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International conference on wafer scale integration : proceedings, San Francisco, California, USA / sponosreseored by IEEE Computer Society, IEEE Components, Hybrids, and Manufacuturing Technology Society ; edited by Vijay K. Jain and Peter W. Wyatt

資料種別:

図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society Press, 1992

形態:

363 p. ; 24 cm

著者名:

ISBN:

9780818624827 [0818624825] (: case)
9780818624810 [0818624817] (: micro)

書誌ID:

BA17242835

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	92CH30882
注記:	"IEEE catalog number 92CH3088-2." Includes index
言語:	英語

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