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International conference on wafer scale integration : proceedings, San Francisco, California, USA / sponosreseored by IEEE Computer Society, IEEE Components, Hybrids, and Manufacuturing Technology Society ; edited by Vijay K. Jain and Peter W. Wyatt

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society Press, 1992
形態:
363 p. ; 24 cm
著者名:
ISBN:
9780818624827 [0818624825] (: case)
9780818624810 [0818624817] (: micro)
書誌ID:
BA17242835
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