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Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:
図書
出版情報:
New York, NY (345 E. 47th St., New York 10017) : IEEE, c1991
形態:
vii, 308 p. ; 28 cm
著者名:
ISBN:
9780780301887 [0780301889] (: soft.)
9780780301894 [0780301897] (: micro.)
書誌ID:
BA19123906
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