Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA

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Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA / sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:

図書

出版情報:

New York, NY (345 E. 47th St., New York 10017) : IEEE, c1991

形態:

vii, 308 p. ; 28 cm

著者名:

ISBN:

9780780301887 [0780301889] (: soft.)
9780780301894 [0780301897] (: micro.)

書誌ID:

BA19123906

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	Chip-to-system test concerns for the 90's 91TH03533
注記:	Includes bibliographical references "IEEE catalog number 91TH0353-3"--T.p. verso
主題:	Integrated circuits--Very large scale integration--Testing--Congresses
言語:	英語

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