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Autotestcon '87 : proceedings : Nobember 3-5, 1987, IEEE International Automatic Testing Conference, Moscone Convention Center, San Francisco / sponsored by, the Institute of Electrical and Electronics Engineers ... [et al.]

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図書
出版情報:
Piscataway, NJ : IEEE, c1987
形態:
xvii, 494 p. ; 28 cm
著者名:
書誌ID:
BA19385560
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