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Characterization of semiconductor materials / Philip F. Kane, Graydon B. Larrabee

資料種別:
図書
出版情報:
New York : McGraw-Hill, c1970
形態:
xvi, 351 p. ; 26 cm
シリーズ名:
Texas Instruments electronics series <BA07535225>
著者名:
ISBN:
9780070332737 [0070332738]
書誌ID:
BA19674681
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