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Fifth annual IEEE International Conference on Wafer Scale Integration : 1993 proceedings, San Francisco, California, USA / edited by Peter W. Wyatt and R. Milke Lea ; sponsored by IEEE Computer Society, IEEE Components, Hybrids, & Manufacturing Technology Society

資料種別:
図書
出版情報:
Los Alamitos, Ca. ; Tokyo : IEEE Computer Society Press, c1993
形態:
ix, 374 p. ; 24 cm
著者名:
ISBN:
9780780308671 [0780308670]
書誌ID:
BA19697031
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